Shared Facilities

The X-Ray Diffraction SEF contains a suite of 8 diffractometers for analysis of polycrystalline, single crystal, thin film, polymer, and nanostructured samples.

The Crystal Growth shared experimental facility in the CMSE is a resource available to users within and outside of MIT community. We have optical floating-zone furnaces, top-seeded growth furnaces, 3-zone tube furnace, box furnaces, arc melting furnace and cutting/polishing equipments to satisfy the needs of crystal growth.

This facility has equipment for both Transmission Electron Microscopy (TEM), which allows the researcher to form images of thin slices or finely divided powders of samples at a resolution of down to 0.18nm, and for Scanning Electron Microscopy (SEM), a tool for visualizing the surface of solid samples with a resolution that can approach 1nm.

Analytical techniques available include Auger spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy, and several kinds of thermal analysis. A wide array of spectrophotometric techniques, including UV-visible-near IR spectrophotometry, Fourier transform infrared spectroscopy, Raman spectroscopy and fluorimetry are also available.