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The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison

The central NIAC facility has provided materials researchers and industrial clients with electron microscopy imaging and analytical analysis, surface analysis and x-ray diffraction serves for over 25 years. The NIAC houses:
 

  • J.A. Woollam Variable Angle Spectroscopic Ellipsometer (VASE) and Infrared VASE (IR-VASE) systems
  • Cameca Local Electrode Atom Probe
  • Three scanning electron microscopes with Electron Dispersive X-ray spectrometers
  • Four transmission electron microscopes, with Cryo TEM tomography and an FEI Titan aberration corrected (S)TEM
  • A surface analysis instrument: a Thermo Fisher k-alpha X-Ray Photoelectron Spectrometer
  • Three atomic force microscopes including a Bruker Icon and a Bruker Catalyst BioAFM
  • Two dual-beam focused ion beam instruments, including a Plasma Focused Ion Beam
  • An Andor Spinning Disk Confocal Microscope
  • A confocal micro-Raman spectrometer (Horiba LabRAM HR Evolution)
  • A small-angle x-ray diffractometer (SAXS)
  • Three additional Diffractometers
  • A ZYGO Optical Interferometer
  • A Horiba Nanolog spectrofluorometer
  • A UV/VIS Dual Beam Fluorometer

For use, questions or more information, please contact the DIrector of MRSEC facilities:

Dr. Jerry Hunter

(608) 263-1073

jerry.hunter@wisc.edu